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ISSN 2380-4505
Symposium Proceedings
Vol. 2024, Issue Symposium, 2024February 13, 2025 EDT

Study of Thermal Conductivity and Reliability of InAg Soldering Thermal Interface Material by Formic Acid Reflow for TIM1 IC Module Package

Jacob Wells, Jie Geng, Guangyu Fan,
Vacuum reflowReliabilityPreformvoidingIndium Silver
https://doi.org/10.4071/001c.129753

Articles in Vol. 2024, Issue Symposium, 2024

Vol. 2024, Issue Symposium, 2024
  • Demonstration of Integrated Solenoid Transformer Balun in Glass Substrate Utilizing TGVs
    Jein YuInsup HanJongmin Yook
  • New Interconnection Technologies Based on Ni Micro-plating Bonding for High-temperature Resistant Power Device Packaging
    Mayu MiyagawaTakumi OnoderaMasayoshi NakagawaWEI XingKeiko KoshibaTomonori IizukaMasakazu InagakiIsamu MorisakoKohei Tatsumi
  • Control of the Surface Modification of Epoxy Resin by VUV-Redox Method using Vacuum Ultraviolet Light
    S. EndoA. ShimizuK. Fukada
  • Exploring Effective Thermal Conductivity and Thermal Resistance of Conductive Film Adhesive Bondline for High Power Density Applications
    Weiyu ZhangStone ChengYuan Zhao
  • In-air Cu Sintering with Partial Encapsulation System for SiC Power Module
    YehRi KimEunjin JoDongjin Kim
  • Effect of Bonding Pressure on Thermal Performance of Graphene-enhanced Thermal Interface Materials for Immersion Cooling Applications
    Kristoffer HarrYuanyuan WangKurban YasinJiabin ChenJin ChenJohan MöllerJohan Liu
  • Liquid Metal Jetting for High-Performance Computing Applications
    Sunny AgarwalMiloš Lazić
  • Printable Epoxy Paste for Varistor Applications
    Nicholas KrascoPaul CzubarowZhixiang LuArianna RothfussScott CopelandTony BarreteToshiyuki SatoKazunari Imai
  • Ultra-low Loss Build-up Film Dielectric for Advanced Packaging
    Yuya SuzukiMami NosakaKazutaka NakadaKazuyoshi Yoneda
  • Using a Novel Co-Design Prototyping Approach for System-in-Package Devices
    Matthew MonroeGokul KumarJustin LockeKeith Felton
  • Optimizing Chiplet Disaggregation with Package Technology
    Trent UehlingJulian PontesCarl CulshawKarl Leiss
  • Molded SiP Manufacturing with Integrated Shielding Layer for Optimized EMI Robustness
    Karl-Friedrich BeckerS. VogesL. BeckerG. SafakO. NallawegF. MüllerChristian TschobanMarc DreissigackerM. A. YounisR. MaretzkiM. WallrodtTanja BraunMartin Schneider-Ramelow
  • HPC Packaging Platform Including Compression Molding
    Marius AdlerKarl-Friedrich BeckerTanja BraunMarc DreissigackerOle HoelckA. GaeblerUwe MaassIvan NdipK. ZoschkeMichael SchifferMartin Schneider-Ramelow
  • The Quarter Factor Prediction of Mold Void Mechanism between Structure Ratio and Molding Gate
    Tzu Chieh ChienShih Kun LoZong Yuan LiMin Yen HsuYen Hua KuoHui Chung LiuLu Ming LaiKuang Hsiung Chen
  • Multi NoC Performance Driven Exploration on FPGA SoC for Industrial Applications
    Daksha SharmaPritam MajumderMikhail GaleevJohanan Agarwal
  • Study of the Effect of Gravity Weight on Strip Warpage
    Elizabeth FortinNathan WhitchurchWei LinEunSook Sohn
  • Multiphysics Reliability Simulation and Validation of a Flip-Chip Build-Up Film Crack via Piezoresistive Stress Sensor
    Yutaka SuzukiJaimal WilliamsonBlake TravisTobias FritzCynthia ChapaRajen Murugan
  • Electrolytic Deflash & High-pressure Water Jet Simulation Driven Delamination Risk Assessment in Plastic Packages
    Sharan KishoreYaxiong ChenTorsten HauckDavid Dougherty
  • Effects of Constraints on Solder Joint Reliability of Electronic Packages
    Arvind PurushotamanNatalie RainesMasoud AngasRobert ManzanaresNathan Blattau
  • Evaluation and Process Optimization of Heat-Curable Thermal Interface Materials for Advanced Packages
    Kevin CoxJoanna PainterGhassan Abu-hamdehSteven TonthatMatt BordenJason Krantz
  • Solder Joint Reliability of Glass Core Substrate Assembly
    John H LauNing LiuMike MaTzyy-Jang Tseng
  • Thermal Expansion Control of Printed Circuit Boards Using Copper-Molybdenum Composite Materials
    Yohei ItoKenjiro TakanishiTatsuya SakamotoKeisuke FujiwaraHitoshi Arai
  • Prediction of an Industrial Framework for Semiconductor Fabrication and Experimental Validation OF 300 mm Wafer
    Da-Woon JeongSe-hyun ChaTae-Hyun KimWangyu GwakYangwook ChoiHyeongGeun AnEun-Ho Lee
  • LidroCUT – Ultrashort-pulsed Laser Processing in Liquids for Clean Dicing in One Process Step
    Jan-Philipp WesselsKatharina LaakeJan Stefan HoppiusAlexander Kanitz
  • High Performance and Cost-Effective Wafer Bumping Approach with Solder Paste Printing for Small LED Die
    HanWen ZhangGuo An "Andy" LiKung Chuan "Kenny" ChiongHui Kai "Vito" HsuB. Senthil KumarChze Min "Jason" LimThiam Chye Lim
  • Fan-Out Chip-Last Panel-Level Packaging for Heterogeneous Integration
    C. LinJ. H. LauC. ChenH. YangT. XiaC. KoB. LinM. MaT. Tseng
  • Development of High Density, Enhanced Reliability Wafer Level Packages
    Gaurav SharmaMengYao SuVarun ThukralCraig BeddingfieldNishant Lakhera
  • Low Warpage Liquid Compression Molded Underfill for Wafer Level Packaging
    Yijia MaJimmy NguyenRose HaMark HoshiyamaTim ChampagneKail ShimRaj Peddi
  • Trace Fusing Current Simulation in the Redistribution Layer of Wafer Level Packages
    Nathan WhitchurchJeongMin JuJiYeon YoonEunSook SohnKyungRok Park
  • Enabling High-density Heterogeneous Integration using Wafer-scale Chiplet Reconstitution Technology
    Ashita VictorMuhannad S. Bakir
  • Advancing Semiconductor Packaging: Intelligent Architectures for Heterogeneous Integration Assembly
    Glenn Farris
  • Panel-level Fan-out: Relationship Between Panel Size and Cost Reduction
    Amy Lujan
  • Novel Approach Solder Paste Printing on 90μm Pitch Application
    B. Senthil KumarLim Chze (Jason) MinYam Lip HueiZhang Rui FenEdrina Risson OlakkankalZhang Rui HanWenKang Sungsig SS
  • Investigation for the Influences of Factors Within the Semi-Additive Process (SAP) on Nanovoid Formation in the Cu-Cu Interface by STEM Analysis
    Kanji MatsumotoHisamitsu Yamamoto
  • Difference Between 85 °C/85 %RH Accelerated Life Test and Pressure Cooker Test on Copper/Epoxy Bonding
    Ran LiuShuaijie ZhaoChuantong ChenYang LiuMinoru UeshimaHirose SuzukiHiroto TakenakaKatsuaki Suganuma
  • Comparison of High-Frequency Transmission Characteristics of Transmission Lines on Copper-Plated Cycloolefin Polymer Using Directly Sputtered Copper Seed Layer and Electroless Copper Plating Seed Layer
    Akihiro ShimizuKazuhiro FukadaShinichi EndoMitsunori AbeAkiko Matsui
  • On-Shore Assembly Solutions for Long-Lifecycle Systems
    Edward Fontanilla
  • High Performance mmWave Ribbon Bonding using 1x20 mil Gold Ribbon
    David J. Rasmussen
  • Thermal Optimization and Experimental Demonstration of a Silicon Carbide, Half-Bridge PowerModule
    Gilberto MorenoJoshua MajorFaisal KhanSreekant Narumanchi
  • Selecting Strip-Based or Singulated Laminates in Chiplet Packaging
    Brendan C. Wells
  • Heterogeneous Integration Structure - FOSub for High End Product Substrate Development
    Sheng LeeYan Wen ChungWen Hung HuangMin Lung HuangYue Nung LinJen Kuang Fang
  • Substrate Warpage Study for Heterogeneous Packages
    Hoon JungDrake MillerGookJin Jung
  • An Open Chiplet Ecosystem for Constructing System-in-Package with Universal Chiplet Interconnect ExpressTM (UCIeTM)
    Debendra Das SharmaMichael Mingliang Liu
  • Laser Assisted Bonding for Flip Chip Interconnection of Very Large Chips
    Cheikh Samba SarrDavid DanovitchMalak KansoPascale GagnonMarc-Olivier Pion
  • Megachip: An Advanced Packaging Solution for Chiplet Integration
    Rabindra N. DasJason PlantMatthew RicciRyan JohnsonPaul W. Juodawlkis
  • An Innovative Approach for Advanced Packaging in 3D System Integration using Reconstructed Wafer-to-Wafer Bonding
    Sanghoon LeeKyounglim SukWoojin JangGwangjae JeonJaegun ShinDonghwi KimKwangjin MoonJaewha ParkSeokhyun LeeSujin Ahn
  • Fan-Out Embedded Bridge with TSV (FO-EB-T) Package Solution for Enhancing HPC Application
    Steven LinDavid HoYu-Po Wang
  • Materials and Process Study for Polymer Hybrid Bonding
    Masaya JukeiKota NomuraYugo TanigakiTakenori FujiwaraHitoshi ArakiTomoyuki HondaYu Shoji
  • Optimizing Flip Chip Packaging for High Density Bump via Mold Flow Simulation with Through-Holes
    Tzu Chieh ChienShih Kun LoZong Yuan LiChia Tso HsiehYen Hua KuoHui Chung LiuLu Ming LaiKuang Hsiung Chen
  • Enhancing Signal Integrity in High-Performance Electronics through Advanced TGV Fabrication with LPKF's LIDE Technology
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  • Fabrication and Passive Assembly of Broadband Evanescent Couplers for Sustainable Pbps Co-Packaged Optics
    Drew WeningerSamuel SernaLuigi RannoLionel KimerlingAnuradha Agarwal
  • Ultra-High Density RDL on Glass Core Substrate for Heterogenous Integration
    Takamasa TakanoSatoru KuramochiMasaya Tanaka
  • Development of Virtual Material Approach for Modeling Viscoelasticity of Underfill in Flip Chip Packages
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  • Using FEM Simulation to Predict the Mechanical and Thermal Performance of FO-EB-T Package
    Shane Lin LinVito LinTeny ShihAndrew KangY.P. Wang
  • Characterization of Thermally-Enhanced Advanced Electronic Flip Chip CSP Packages
    Nahid Aslani AmoliKarthekeyan SridharSnehamay SinhaJaimal WilliamsonHiep NguyenArvin VerdeflorAyushi PradhanKathleen Timbol
  • Numerical Simulation on Stress on C4 Bump Distribution of Silicon Interposer
    Haijie ChenZiyao BianTao LiuQiang ZhaoYaojian LinJielei Xie
  • Study of Thermal Conductivity and Reliability of InAg Soldering Thermal Interface Material by Formic Acid Reflow for TIM1 IC Module Package
    Jacob WellsJie GengGuangyu Fan
  • A Novel High Resolution Dry Film Photo-Imageable Dielectric for Redistribution Layer in Advanced Packaging Applications
    Gregory ProkopowiczYaming JiangColin HayesMichael GallagherMark ReynoldsAndrew LotzKevin WangZhou (Joe) LuChristopher Gilmore
  • Enhancing Electrical Conductivity of Epoxy Resin Based Conductive Pastes Through the Use of NanoStrandTM Silver
    Ehsan MarzbanradPeter SextonEduardo Gonzalez-Martinez
  • Pushing the Limits of Miniaturization in Microelectronic Packaging via the Application of Ultra-Thin Micro Dam Structures
    Patrick SchirmerSeverin RingelstetterKian Chong TaiMuizzuddin Azfar
  • Next Generation Phase Change Material for High Power Electronics
    Rita MohantyTho Quang Nguyen
  • Applying Machine Learning to the Smart Welding of Cylindrical Lithium-ion Battery Cells within Battery Modules
    Mike McKeown
  • Fine Gold and Coated-Ag Bonding Wire: Vertical Wire Bonding
    Sarangapani MuraliDhayalan MariyappanTuriano Alejandro Jr AdvinculaChong Mei Joanne HoeLim Yee Evonne WeonKang Sungsig SS
  • Gas-free & Nano Al2O3-coated Ag Bonding Wire for Replacing Au Wire
    Soojae ParkEunmin ChoSiyeong OhHongsik Kim
  • Cause and Prevention of Large Void Formation in Flip Chip Solder Connections
    J. Ramirez RamosT. MarinisD. Hanson
  • Advanced 3D Integrated Circuit Packaging: Metallurgical Improvement and FLOLA (Flux-Less Oxide-removal Laser Assembly) Process at a 9㎛-Pitch Micro-Bump
    Seok-Geun AhnJu-Hyeon OhGwang-Jae JeonDae-Ho LeeSun-Woo ChoiKyoung-A KimHyo-Kyeong YunJin-Young ChoiSeok-Hyun LeeSu-Jin Ahn
  • Metastable Fine Grain Cu for Hybrid Bonding Applications
    Pingping YeJianwen HanStephan BrayeAbdelhamid ElSawyHarshul KhannaVeronica HayesAdam LetizeKyle WhittenThomas RichardsonElie Najjar
  • Control of Cu Microstructure and Properties for Low-Temperature Direct Cu-Cu Bonding
    Cara GannettYoungmin YoonGabrielle PageDerek ThoresenBrian ParquetteMatthew GoleMatthew Van HanehemRavi Pokhrel
  • Pitch Interconnection and Packaging Studies for Hybrid Electronics with Aerosol Jet Printed Particle-Free Ag Ink
    Abdullah S. ObeidatDylan RichmondJordan Howard-JenningsAshraf UmarRiadh Al-HaidariMohammed AlhendiBehnam GarakaniDetlef-M. SmilgiesMark D. Poliks
  • Ultra-Precise Dispensing in 3D Packaging: A Seamless Shift from R&D to Production
    Nina SzczotkaAleksandra MotykaAleksandra ChudzyńskaMateusz ŁysieńAleksandra PerczyńskaAnna SzczurekŁukasz WitczakPiotr KowalczewskiAneta Wiatrowska
  • The Effect of Conductor Processing and Properties on Additively Manufactured Antenna Performance
    Emuobosan EnakerakpoWaleed Tawfik Al-ShaibaniOlya Noruz ShamsianRiadh Al-HaidariAbdullah S. ObeidatAshraf UmarMohammed AlhendiMark Poliks
  • Measurement-based Characterization and Application of Low-Loss Dielectric Materials for Development of 6G Sub-THz Antennas
    Ivan NdipThi Huyen LeKavin Senthil MurugesanJens SchneiderLutz GerholdHabib HichriRyohei OishiReki NakanoMartin Schneider-Ramelow
  • Processing Tank Flow Mechanics for Next Generation Glass Core Substrates
    Vladimir KudriavtsevRajeev BajajChris LaneZia Karim
  • High-Performance Structures with Photo-Imageable Pastes for mmWave Applications
    Kathrin ReinhardtLynn RatajczakStefan KörnerUwe Partsch
  • The Ideal Switch® with Advanced Glass Packaging
    Aric ShoreyJeff BalounMark Walker
IMAPSource Conference Papers
Wells, Jacob, Jie Geng, and Guangyu Fan. 2025. “Study of Thermal Conductivity and Reliability of InAg Soldering Thermal Interface Material by Formic Acid Reflow for TIM1 IC Module Package.” IMAPSource Proceedings 2024 (Symposium): 391–95. https://doi.org/10.4071/001c.129753.
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