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Symposium Proceedings
Vol. 2024, Issue Symposium, 2024February 13, 2025 EDT

Study of Thermal Conductivity and Reliability of InAg Soldering Thermal Interface Material by Formic Acid Reflow for TIM1 IC Module Package

Jacob Wells, Jie Geng, Guangyu Fan,
Vacuum reflowReliabilityPreformvoidingIndium Silver
https://doi.org/10.4071/001c.129753
IMAPSource Conference Papers
Wells, Jacob, Jie Geng, and Guangyu Fan. 2025. “Study of Thermal Conductivity and Reliability of InAg Soldering Thermal Interface Material by Formic Acid Reflow for TIM1 IC Module Package.” IMAPSource Proceedings 2024 (Symposium): 391–95. https:/​/​doi.org/​10.4071/​001c.129753.
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