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ISSN 2380-4505
Device Packaging Conference Presentations
Vol. 2024, Issue DPC, 2024January 14, 2025 EDT

A Study of Low Temperature Solder on Microstructure and Reliability

Allen Xu, Nokibul Islam, Joe Liu, Xiaojing Mu, Yaojian Lin, Danfeng Yang,
low temperature soldermicrostructurereliabilityLTS
https://doi.org/10.4071/001c.128393
IMAPSource Conference Papers
Xu, Allen, Nokibul Islam, Joe Liu, Xiaojing Mu, Yaojian Lin, and Danfeng Yang. 2025. “A Study of Low Temperature Solder on Microstructure and Reliability.” IMAPSource Proceedings 2024 (DPC): 261–97. https:/​/​doi.org/​10.4071/​001c.128393.

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