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Device Packaging Conference Presentations
Vol. 2024, Issue DPC, 2024January 14, 2025 EDT

A Novel, Automated Measurement and Analysis Technique forBonding Energy of Fusion and Hybrid Wafer to Wafer Bonding

Andrew Tuchman, Satohiko Hoshino, Adam Gildea, Christopher Netzband, Ilseok Son,
wafer-to-wafer bondingbonding strengthDCB methodDual Cantilever Beam
https://doi.org/10.4071/001c.128386
IMAPSource Conference Papers
Tuchman, Andrew, Satohiko Hoshino, Adam Gildea, Christopher Netzband, and Ilseok Son. 2025. “A Novel, Automated Measurement and Analysis Technique forBonding Energy of Fusion and Hybrid Wafer to Wafer Bonding.” IMAPSource Proceedings 2024 (DPC): 175–90. https:/​/​doi.org/​10.4071/​001c.128386.
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