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Device Packaging Conference Presentations
Vol. 2021, Issue DPC, 2021April 09, 2024 EDT

Process Improvements for First Pass Yield Gains during Tri-Temperature Automotive Package Test

Jerry J. Broz, Bret A. Humphrey,
first pass yield gainsprocess improvementtri-temperature automotive package testautomated contactor cleaning (ACC)
https://doi.org/10.4071/001c.116355
IMAPSource Conference Papers
Broz, Jerry J., and Bret A. Humphrey. 2024. “Process Improvements for First Pass Yield Gains during Tri-Temperature Automotive Package Test.” IMAPSource Proceedings 2021 (DPC): 932–56. https:/​/​doi.org/​10.4071/​001c.116355.
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