All Articles tagged under bump metallurgy
- General
October 01, 2021 EDT The experimental study described herein investigates thermomigration of both eutectic Sn/Pb and lead free Sn/Ag/Cu solder joints, with the additional focus on the development of an Arrhenius failure model of...
- Symposium Proceedings
January 01, 2011 EDT In this study, the wafer bumping and characterization of fine-pitch lead-free solder microbumps on 300mm wafer for 3D IC integration are investigated. Emphasis is placed on the Cu-plating solutions (conformal...
- Symposium Proceedings
January 01, 2010 EDT The “Black Pad” phenomenon referring to blackening of electrolessly plated nickel-phosphorous (Ni(P)) films after the immersion gold (IG) process was reproduced using pure chemicals for the first time. Chemical composition...