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High Temperature Conference Papers
Vol. 2014, Issue HITEC, 2014January 01, 2014 EDT

High Temperature Dynamic Pressure Measurements Using Silicon Carbide Pressure Sensors

Robert S. Okojie, Roger D. Meredith, Clarence T. Chang, Ender Savrun,
SiC Pressure SensorDynamic TestHigh Temperature
https://doi.org/10.4071/HITEC-TA25
IMAPSource Conference Papers
Okojie, Robert S., Roger D. Meredith, Clarence T. Chang, and Ender Savrun. 2014. “High Temperature Dynamic Pressure Measurements Using Silicon Carbide Pressure Sensors.” IMAPSource Proceedings 2014 (HITEC): 47–52. https:/​/​doi.org/​10.4071/​HITEC-TA25.
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