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High Temperature Conference Papers
Vol. 2011, Issue HITEN, 2011January 01, 2011 EDT

Reliability Assessment of Passives for 300°C and 350°C

David Shaddock, Alexey Vert, Tan Zhang, Rui Zhang, R. Wayne Johnson,
High TemperatureCapacitorResistors
https://doi.org/10.4071/HITEN-Paper1-DShaddock
IMAPSource Conference Papers
Shaddock, David, Alexey Vert, Tan Zhang, Rui Zhang, and R. Wayne Johnson. 2011. “Reliability Assessment of Passives for 300°C and 350°C.” IMAPSource Proceedings 2011 (HITEN): 1–6. https:/​/​doi.org/​10.4071/​HITEN-Paper1-DShaddock.
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