Reliability Assessment of Passives for 300°C and 350°C

David Shaddock; Alexey Vert; Tan Zhang; Rui Zhang; R. Wayne Johnson

doi:10.4071/HITEN-Paper1-DShaddock

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Shaddock, David, Alexey Vert, Tan Zhang, Rui Zhang, and R. Wayne Johnson. 2011. “Reliability Assessment of Passives for 300°C and 350°C.” IMAPSource Proceedings 2011 (HITEN): 1–6. https://doi.org/10.4071/HITEN-Paper1-DShaddock.

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