Vol. 2011, Issue HITEN, 2011January 01, 2011 EDT
Reliability Assessment of Passives for 300°C and 350°C
Reliability Assessment of Passives for 300°C and 350°C
David Shaddock, Alexey Vert, Tan Zhang, Rui Zhang, R. Wayne Johnson,
Shaddock, David, Alexey Vert, Tan Zhang, Rui Zhang, and R. Wayne Johnson. 2011. “Reliability Assessment of Passives for 300°C and 350°C.” IMAPSource Proceedings 2011 (HITEN): 1–6. https://doi.org/10.4071/HITEN-Paper1-DShaddock.